CE Mark High and Low Temperature 3-Zone Thermal Shock Testing Chamber for Electronics Reliability Test
1. Thermal Shock Test Chamber Features
1.3-zone design: high temperature zone, cold temperature zone, and testing zone.
2.The test specimens under test are stationary in the testing zone.
3.Touch-control operation interface for ease of use.
4.Max.999H and max.9999 cycles for high or low temperature shock for thermal shock test chamber.
5.Automatic cycling shock or/and manual selective shock are available.
6.Water cooled, binary cooling system for quick cooling effect.
7.Japan imported Seamless Welding Machine, especially for copper pipe welding
2. Description and Application
This machine is used to test the bearing extent of the material structures and composite material in an instant and continuous high temperature and extremely low temperature environment , that is in the shortest time to test its thermal expansion and contraction caused by chemical change or physical harm. Application objects, including metal, plastic, rubber, electronics ... and other materials can be used as a basis to improve their products or reference.
Thermal shock testing exposes products to alternating low and high temperatures to accelerate failures caused by temperature cycles or thermal shocks during normal use. The transition between temperature extremes occurs very rapidly, greater than 15 °C/min.
3. Specification
(1) KTS-A Series
| Model | |
| 72A | 100A | 150A | 200A | 252A | 300A | 480A |
| Inside size(mm) | W | 450 | 500 | 600 | 670 | 700 | 800 | 800 |
| H | 400 | 450 | 500 | 600 | 600 | 600 | 800 |
| D | 400 | 450 | 500 | 500 | 600 | 650 | 750 |
| Outside size(mm) | W | 1490 | 1540 | 1640 | 1720 | 1750 | 1850 | 1850 |
| H | 1790 | 1840 | 1890 | 2000 | 2000 | 2000 | 2200 |
| D | 1600 | 1700 | 1830 | 1850 | 1930 | 1980 | 2500 |
| Test weight | 5 | 10 | 12 | 15 | 18 | 20 | 20 |
| Low Temp Chamber | -55ºC～-10ºC, Pre cooling time: ≤ 60 min from +20ºCto-55ºC |
| Test Chamber | -40ºC～+150ºC |
| High Temp Chamber | +60ºC～+200ºC ,Within 20 min, Pre-heating time |
| Transition time | ≤15S |
| Recovery time | High-Temp Exposure 30 min to reach & stabilize required hot temp of test sample |
| Low-Temp Exposure 30 min to reach & stabilize required cold temp of test sample |
| ≤ 5 min |
| Ambient Temp. | +5ºC～+35ºC |
| Power | AC 380±10％ 50Hz ,3 phase 4 wires +Ground Wires |
(2) KTS-B Series
| Model | |
| 72B | 100B | 150B | 200B | 252B | 300B | 480B |
| Inside size(mm) | W | 450 | 500 | 600 | 670 | 700 | 800 | 800 |
| H | 400 | 450 | 500 | 600 | 600 | 600 | 800 |
| D | 400 | 450 | 500 | 500 | 600 | 650 | 750 |
| Outside size(mm) | W | 1490 | 1540 | 1640 | 1720 | 1750 | 1850 | 1850 |
| H | 1790 | 1840 | 1890 | 2000 | 2000 | 2000 | 2200 |
| D | 1600 | 1700 | 1830 | 1850 | 1930 | 1980 | 2500 |
| Test weight(KG) | 5 | 10 | 12 | 15 | 18 | 20 | 20 |
| Low Temp. chamber | -70ºC～-10ºC ,Pre cooling time: +20ºC～-70ºC ,≤ 60 min |
| Test. Chamber | -55ºC～+150ºC |
| High Temp. chamber temperature | +60ºC～+200ºC,Preheating time: ≤20 min |
| Transition time | ≤15S |
| Recovery time | High-Temp Exposure 30 min to reach & stabilize required hot temp of test sample |
| Low-Temp Exposure 30 min to reach & stabilize required cold temp of test sample |
| ≤ 5 min |
| Ambient Temp. | +5ºC～+35ºC |
| Power | AC 380±10％ 50Hz ,3 phase 4 wires +Ground Wires |
(3) KTS-D Series
| Model | |
| 72D | 100D | 150D | 200D | 252D | 300D | 480D |
| Inside size(mm) | W | 450 | 500 | 600 | 670 | 700 | 800 | 800 |
| H | 400 | 450 | 500 | 600 | 600 | 600 | 800 |
| D | 400 | 450 | 500 | 500 | 600 | 650 | 750 |
| Outside size(mm) | W | 1490 | 1540 | 1640 | 1720 | 1750 | 1850 | 1850 |
| H | 1790 | 1840 | 1890 | 2000 | 2000 | 2000 | 2200 |
| D | 1600 | 1700 | 1830 | 1850 | 1930 | 1980 | 2500 |
| Test weight | 5 | 10 | 12 | 15 | 18 | 20 | 20 |
| Low Temp Chamber | -80ºC～-10ºC, Pre cooling time: ≤ 60 min from +20ºCto-80ºC |
| Test Chamber | -65ºC～+150ºC |
| High Temp Chamber | +60ºC～+200ºC ,Within 20 min, Pre-heating time |
| Transition time | ≤15S |
| Recovery time | High-Temp Exposure 30 min to reach & stabilize required hot temp of test sample |
| Low-Temp Exposure 30 min to reach & stabilize required cold temp of test sample |
| ≤ 5 min |
| Ambient Temp. | +5ºC～+35ºC |
| Power | AC 380±10％ 50Hz ,3 phase 4 wires +Ground Wires |
4. Product Details Picture:
Product Tags:
|
|
CE Mark High and Low Temperature 3-Zone Thermal Shock Testing Chamber Images
|
